The 11801C Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform processing capabilities of any multi-Gigahertz scope. With excellent measurement repeatability, exceptional vertical resolution and fast display update rate, the 11801C is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables, and high speed digital data communications.

Tektronix 11801C Features

• DC To 50 Ghz Bandwidth
• 7 Ps Rise Time
• Eight Channels, Expandable to 136 (with SM-11 multi-channel units)
• High Resolution and Measurement Repeatability
• 10 Femtosecond Sampling Interval (0.01 ps)
• Modular Architecture
• Dual Timebase Allows Multiple Windows
• FFT
• Predefined Telecom Masks
• True Dual-Step Differential TDR
• Fully Automatic Jitter and Noise Measurements
• Automatic Statistical Measurements, Histograms and Mask Testing
• Automatic Pulse Measurements with Statistics
• Comprehensive Waveform Processing
• Complete Programmability for ATE Applications
• Color Display with Color Grading Applications
• Semiconductor Test
• TDR Characterization
• High Speed Digital
• Data Communication