Hioki 3535 LCR HiTESTER

High-speed LCR meter with up to 120MHz sampling High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development

• Broad Frequency Measurement Range ( 100 kHz to 120 MHz)
• High speed LCR testing (6ms/sample)
• 14 Parameter Types ( |Z|, |Y|, T, Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan d) and Q )
• Detachable Head Amp
• Load Compensation Function
• BIN ( Classification ) Measurement

SPECIFICATIONS:

• Measurement Frequency 100 kHz to 120 MHz ( 100Hz to 100kHz steps )
• Basic accuracy |Z|: ±0.5 % rdg. , phase angle: ±0.3°
• Output Impedance 50 ±10 ohm (at 100 kHz)
• Measurement Signal Level 5 mV to 1 V, 20 mA max. (up to 10.00 MHz) 5 mV to 500 mV, 10 mA max. (above 10.01 MHz)
• Setting Resolution: 1mV steps 200 µA to 20 mA: 1 V max. ( up to 10.00 MHz ) 200 µA to 10 mA: 0.5 V max. (above 10.01 MHz)
• Setting Resolution: 10 µA steps
• Measurement Time 6 ± 1 ms (nominal)
• Other function Monitor Function, Limit Function, Average Trigger Function, Load Compensation Function, Key Lock Function, Comparator, Classification ( BIN ) Measurement, Correlation, Compensation Function, Panel Save and Load, Measurement Value Storage, Zoom Display Function, Continuous Measurements, Audible Beeper, Numerical Display, Digit Setting Function, Display Setting Functions, Printer Function
• Interfaces GP-IB, RS-232C and EXT I/O ( standard )
• Power 100 to 240 VAC, 50/60 Hz, 50 VA
• Dimensions and Mass Approx. 360W×130H×360D mm, 8.3 kg
• Supplied accessories Power cord