NOTE: Image is representative and may not be actual configuration.
HP/Agilent 4155B Semiconductor Parameter Analyzer
Description
HP 4155B Semiconductor Parameter Analyzer Description The 4155B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format (graph, list, matrix or schmoo) on a built-in CRT display.
Features
High-resolution/accuracy and wide range.
1 fA to 1 A
1µV to 200 V
Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs
Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
Time-domain measurement: 60µs–variable intervals, up to 10,001 points
Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
Built-in HP Instrument BASIC, trigger I/O capability
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Satisfaction Guaranteed!
All Global Test Supply purchases offers a 5 day right-of-return. If the equipment you purchase does not meet your expectations, you have 5 business days to return for an exchange or full refund.