The Agilent 81910A enables exhaustive analysis of advanced photonic devices, covering all physical properties relevant to DWDM components in a single solution:

• Simultaneous all-optical measurement of loss (IL) / return loss (RL), polarization dependent loss (PDL), group delay (GD) and different group delay (DGD)
• Display of chromatic dispersion (CD) and polarization mode dispersion (PMD)
• Simultaneous transmission and reflection measurement
• All measurements made in swept-wavelength mode for shortest test time at picometer wavelength resolution
• Accurate loss and GD results by calculation from the true average of their polarization dependency
• The unique combination of Mueller Matrix method for loss measurement and Jones matrix method for interferometric dispersion measurement yields best accuracies in all axes FEATURES:
  • Real time trace updates enable the adjustment of all device parameters, and feedback to automated process control
  • Direct access to Mueller Matrix and Jones Matrix for deepest insight into a device's transmission and reflection properties: eigenvalues, TE/TM mode traces, impulse response, second order PMD and more
  • Application-Programmable Interface (API) for custom analysis, remote control and automation, and integration with simulation software solutions
  • Optional Agilent 81600B #200 all-band laser extends the measurement range to 1477 nm to 1620 nm
  • Software-enabled multi-port testing and new noise threshold feature for more convenient analysis of multichannel devices