The 4155C Semiconductor Parameter Analyzer is Agilent's next generation of precision semiconductor parametric analyzers. The 4155C provides cost-effective, accurate laboratory bench top parameter analyzers for advanced device characterization. The low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the 4155C provide a firm foundation for future expansion with other measurement instruments. The 41501B Expander extends your capabilities to 1A/200V, and add a low noise ground unit and dual pulse generators on the 4155C.

The 4155C offers all-in-one packaged solutions with Agilent's PC-based Parametric Analysis and Characterization Environment. Standard configurations include a parameter analyzer, Agilent I/CV 2.1 Lite Automation Software, and a notebook PC controller with Windows XP™ Professional operating system. I/CV 2.1 Lite software provides a graphical user interface, powerful analysis tools, prober drivers, and automation tools.